Mesure des caractéristiques électriques des semi-conducteurs par unité SMU S100 DC 30V 1A
Prix: Negotiable
MOQ: 1 unit
Heure de livraison: 2-8 weeks
Marque: PRECISE INSTRUMENT
Souligner:Semiconductor Electrical Characteristics Testing SMU Unit, DC S100 SMU Unit, S100 30V 1A SMU Measurement
Semiconductor Electrical Characteristics Testing SMU Unit S100 DC 30V 1A SMU Measurement The S100 Source Measure Unit, meticulously crafted by PRECISE INSTRUMENT, is an outstanding representative of domestic testing equipment. It breaks the long-standing monopoly of foreign technology and delivers a... Voir plus
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Unité DP100B de mesure de la tension / du courant à double canal 30V 30A
Prix: Negotiable
MOQ: 1 unit
Heure de livraison: 2-8 weeks
Marque: PRECISE INSTRUMENT
Souligner:30V 30A Dual Channel Source Meter, DP100B Source Meter Unit, Voltage Current SMU unit
30V 30A Dual Channel Source Meter Unit DP100B With Voltage / Current Measurement The DP100B dual channel high precision desktop pulse source measure unit is the newly developed high precision, large dynamic, digital touch source measure unit that based on the single channel pulse desktop source meas... Voir plus
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Unité de mesure de la source d'impulsion de 18V 1A à quatre canaux sous carte CBI403 SMU
Prix: Negotiable
MOQ: 1 unit
Heure de livraison: 2-8 weeks
Marque: PRECISE INSTRUMENT
Souligner:18V 1A Four Channel Source Measure, Sub Card Pulse Source Measure Unit, CBI403 SMU Measurement
18V 1A Four Channel Sub Card Pulse Source Measure Unit CBI403 SMU Measurement The CBI401 modular subcard is a member of the CS Series Source Measure Unit (SMU) family, designed for high-precision, high-dynamic-range electrical characterization. Its modular architecture allows flexible integration wi... Voir plus
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300A 30V alimentation par impulsion haute source de courant HCPL030 pour SiC IGBT GaN HEMT test
Prix: Negotiable
MOQ: 1 unit
Heure de livraison: 2-8 weeks
Marque: PRECISE INSTRUMENT
Souligner:300A 30V Pulse Power Supply, 300A 30V High Current Source, HEMT Test Pulse Power Supply
300A 30V Pulse Power Supply High Current Source HCPL030 For SiC IGBT GaN HEMT Test The HCPL030 series high - current pulse power supply is a pulse constant - current source. The product features steep output pulse edges (10μs), high testing efficiency (40ms, with external control relay), support for... Voir plus
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Unité de mesure de la source d'alimentation haute tension 1200V 100mA pour l'essai de tension de panne IGBT
Prix: Negotiable
MOQ: 1 unit
Heure de livraison: 2-8 weeks
Marque: PRECISE INSTRUMENT
Souligner:High Voltage Power Source Measure Unit, 1200V 100mA High Voltage Power Source, IGBT Breakdown High Voltage Power Source
1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test The E100 is a high-performance high voltage source measure unit specifically designed for high voltage testing environments. It can output and measure voltages up to 1200V, and accurately measure weak current signals as low as 1nA... Voir plus
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20A CW / 20A QCW Test d'alimentation au laser HCPL002 Énergie au laser à diode haute puissance
Prix: Negotiable
MOQ: 1 unit
Heure de livraison: 2-8 weeks
Marque: PRECISE INSTRUMENT
Souligner:20A QCW Testing Laser Power Supply, 20A CW Testing Laser Power Supply, HCPL002 Diode Laser Power Supply
20A CW / 20A QCW Testing Laser Power Supply HCPL002 High Power Diode Laser Power Supply HCPL002 is a high-power laser test power supply designed to meet the most demanding test needs with advanced technology. It has CW and QCW output capabilities, and the CW and QCW currents can reach up to 20A, pro... Voir plus
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1MS/S Carte d'acquisition de données A400 4 canaux Carte Daq à résolution ADC 16 bits
Prix: Negotiable
MOQ: 1 unit
Heure de livraison: 2-8 weeks
Marque: PRECISE INSTRUMENT
Souligner:A400 Data Acquisition Card, 16 Bit ADC Resolution Daq Card, 4 Channels Data Acquisition Card
1MS/S A400 Data Acquisition Card 4 Channels 16 Bit ADC Resolution Daq Card A400 data acquisition card is a plug-in card type independently designed and developed by Psysi, which supports variable rate sampling and large-capacity data storage, with 4 channels in a single card and up to 40 channels in... Voir plus
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Systèmes d'essai des semi-conducteurs pour le vieillissement au laser LDBI Système d'essai multicanal
Prix: Negotiable
MOQ: 1 unit
Heure de livraison: 2-8 weeks
Marque: PRECISE INSTRUMENT
Souligner:Laser Aging Semiconductor Test Systems, LDBI Semiconductor Test Systems, Multi Channel Power Device Analyzer
LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System LDBI multi-channel high-power laser aging system is specifically designed to address the issues of kilowatt-level high-power semiconductor laser chips and pump laser modules that require narrow pulse high current testing and ag... Voir plus
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