Wuhan Precise Instrument Co., Ltd.
Quality Unité de mesure de source, Mètre de source à double canal supplier from China.
All Videos
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00:42
![ldbi laser aging semiconductor test systems multi channel testing system]( "ldbi laser aging semiconductor test systems multi channel testing system")
ldbi laser aging semiconductor test systems multi channel testing system
Apr 23, 2025 -
00:32
![1000a current sensor test system ctms semiconductor testing equipment]( "1000a current sensor test system ctms semiconductor testing equipment")
1000a current sensor test system ctms semiconductor testing equipment
Apr 23, 2025 -
00:39
![10kv/6000a power device analyzer static test pmst for mosfet bjt igbt sic gan semiconductor]( "10kv/6000a power device analyzer static test pmst for mosfet bjt igbt sic gan semiconductor")
10kv/6000a power device analyzer static test pmst for mosfet bjt igbt sic gan semiconductor
Apr 23, 2025 -
00:45
![1200v/100a semiconductor parameter analyzer spa6100 semiconductor test systems]( "1200v/100a semiconductor parameter analyzer spa6100 semiconductor test systems")
1200v/100a semiconductor parameter analyzer spa6100 semiconductor test systems
Apr 23, 2025 -
00:36
![2ms/s multi channel pxi smu high speed data acquisition card a400b high speed daq card]( "2ms/s multi channel pxi smu high speed data acquisition card a400b high speed daq card")
2ms/s multi channel pxi smu high speed data acquisition card a400b high speed daq card
Apr 23, 2025 -
00:32
![1ms/s a400 data acquisition card 4 channels 16 bit adc resolution daq card]( "1ms/s a400 data acquisition card 4 channels 16 bit adc resolution daq card")
1ms/s a400 data acquisition card 4 channels 16 bit adc resolution daq card
Apr 23, 2025 -
00:34
![LDBI Multi-Channel High-Power Laser Aging System]( "LDBI Multi-Channel High-Power Laser Aging System")
LDBI Multi-Channel High-Power Laser Aging System
Feb 26, 2025 -
00:24
![1000A Current Sensor Test System CTMS]( "1000A Current Sensor Test System CTMS")
1000A Current Sensor Test System CTMS
Feb 26, 2025 -
00:30
![10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors]( "10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors")
10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors
Feb 26, 2025 -
00:36
![1200V/100A Semiconductor Parameter Analyzer SPA6100]( "1200V/100A Semiconductor Parameter Analyzer SPA6100")
1200V/100A Semiconductor Parameter Analyzer SPA6100
Feb 26, 2025 -
00:27
![2 MS/s Multi-channel Data Acquisition Card A400B Board High Speed]( "2 MS/s Multi-channel Data Acquisition Card A400B Board High Speed")
2 MS/s Multi-channel Data Acquisition Card A400B Board High Speed
Feb 26, 2025 -
00:24
![A400 Data Acquisition Card with 16-bit ADC Resolution and 1MS/s Sampling Rate]( "A400 Data Acquisition Card with 16-bit ADC Resolution and 1MS/s Sampling Rate")
A400 Data Acquisition Card with 16-bit ADC Resolution and 1MS/s Sampling Rate
Feb 26, 2025 -
00:24
![60A CW/600A QCW High Power Testing Laser Power Supply HCPL060]( "60A CW/600A QCW High Power Testing Laser Power Supply HCPL060")
60A CW/600A QCW High Power Testing Laser Power Supply HCPL060
Feb 25, 2025 -
00:24
![60A CW/60A QCW High Power Testing Laser Power Supply HCPL006]( "60A CW/60A QCW High Power Testing Laser Power Supply HCPL006")
60A CW/60A QCW High Power Testing Laser Power Supply HCPL006
Feb 25, 2025 -
00:24
![20A CW/20A QCW High Power Testing Laser Power Supply HCPL002]( "20A CW/20A QCW High Power Testing Laser Power Supply HCPL002")
20A CW/20A QCW High Power Testing Laser Power Supply HCPL002
Feb 25, 2025 -
00:27
![8000V/40mA High Voltage Power Source E800]( "8000V/40mA High Voltage Power Source E800")
8000V/40mA High Voltage Power Source E800
Feb 25, 2025 -
00:24
![300A/30V High Current Pulse Power Supply HCPL030 For SiC/IGBT/GaN HEMT Test]( "300A/30V High Current Pulse Power Supply HCPL030 For SiC/IGBT/GaN HEMT Test")
300A/30V High Current Pulse Power Supply HCPL030 For SiC/IGBT/GaN HEMT Test
Feb 25, 2025 -
00:24
![3500V/100mA High Voltage Power Source E300]( "3500V/100mA High Voltage Power Source E300")
3500V/100mA High Voltage Power Source E300
Feb 25, 2025 -
00:27
![2200V/100mA High Voltage Power Source E200]( "2200V/100mA High Voltage Power Source E200")
2200V/100mA High Voltage Power Source E200
Feb 25, 2025 -
00:24
![1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test]( "1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test")
1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test
Feb 25, 2025 -
00:24
![1000A/18V High Current Pulse Power Supply HCPL100 For SiC/IGBT/GaN HEMT Test]( "1000A/18V High Current Pulse Power Supply HCPL100 For SiC/IGBT/GaN HEMT Test")
1000A/18V High Current Pulse Power Supply HCPL100 For SiC/IGBT/GaN HEMT Test
Feb 25, 2025 -
00:24
![S300 DC Source Measure Unit 300V/1A for Electrical Characteristic Testing]( "S300 DC Source Measure Unit 300V/1A for Electrical Characteristic Testing")
S300 DC Source Measure Unit 300V/1A for Electrical Characteristic Testing
Feb 24, 2025 -
00:24
![300V/3A Semiconductor Testing DC Source Measure Unit S300B]( "300V/3A Semiconductor Testing DC Source Measure Unit S300B")
300V/3A Semiconductor Testing DC Source Measure Unit S300B
Feb 24, 2025 -
00:24
![30V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P100]( "30V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P100")
30V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P100
Feb 24, 2025 -
00:24
![100V/1A/10A Pulse Source Meter P200 for Characterizing Semiconductors]( "100V/1A/10A Pulse Source Meter P200 for Characterizing Semiconductors")
100V/1A/10A Pulse Source Meter P200 for Characterizing Semiconductors
Feb 24, 2025 -
00:24
![300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300]( "300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300")
300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300
Feb 24, 2025 -
00:24
![300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials]( "300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials")
300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials
Feb 24, 2025 -
00:24
![High Current Pulse Source Measure Unit HCP100 with Max Pulse Output Current 30A and Max Output Voltage 50V]( "High Current Pulse Source Measure Unit HCP100 with Max Pulse Output Current 30A and Max Output Voltage 50V")
High Current Pulse Source Measure Unit HCP100 with Max Pulse Output Current 30A and Max Output Voltage 50V
Feb 24, 2025 -
00:25
![100V/100A High Current Pulse Source Measure Unit HCP300 for IGBT]( "100V/100A High Current Pulse Source Measure Unit HCP300 for IGBT")
100V/100A High Current Pulse Source Measure Unit HCP300 for IGBT
Feb 24, 2025 -
00:24
![300V/30A Dual Channel Source Meter DP300B for Various Electrical Characteristic Tests]( "300V/30A Dual Channel Source Meter DP300B for Various Electrical Characteristic Tests")
300V/30A Dual Channel Source Meter DP300B for Various Electrical Characteristic Tests
Feb 24, 2025 -
00:24
![100V/30A Dual Channel Source Meter DP200B for BJT Test]( "100V/30A Dual Channel Source Meter DP200B for BJT Test")
100V/30A Dual Channel Source Meter DP200B for BJT Test
Feb 24, 2025 -
00:24
![30V/30A Dual Channel Source Meter DP100B with Voltage/Current Measurement and Four Quadrant Operation]( "30V/30A Dual Channel Source Meter DP100B with Voltage/Current Measurement and Four Quadrant Operation")
30V/30A Dual Channel Source Meter DP100B with Voltage/Current Measurement and Four Quadrant Operation
Feb 24, 2025 -
00:26
![10V/500mA Four-channel Sub Card DC Source Measure Unit CS401]( "10V/500mA Four-channel Sub Card DC Source Measure Unit CS401")
10V/500mA Four-channel Sub Card DC Source Measure Unit CS401
Feb 24, 2025 -
00:24
![10V/500mA Four-channel Sub Card Pulse Source Measure Unit CBI401]( "10V/500mA Four-channel Sub Card Pulse Source Measure Unit CBI401")
10V/500mA Four-channel Sub Card Pulse Source Measure Unit CBI401
Feb 24, 2025 -
00:24
![10V/1A Four-channel Sub Card Pulse Source Measure Unit CBI402]( "10V/1A Four-channel Sub Card Pulse Source Measure Unit CBI402")
10V/1A Four-channel Sub Card Pulse Source Measure Unit CBI402
Feb 24, 2025 -
00:28
![18V/1A Four-channel Sub Card Pulse Source Measure Unit CBI403]( "18V/1A Four-channel Sub Card Pulse Source Measure Unit CBI403")
18V/1A Four-channel Sub Card Pulse Source Measure Unit CBI403
Feb 24, 2025 -
00:28
![3-Slots Sub Cards Plug-in Source Measure Unit 1003C with Industrial-Grade Reliability and Scalability]( "3-Slots Sub Cards Plug-in Source Measure Unit 1003C with Industrial-Grade Reliability and Scalability")
3-Slots Sub Cards Plug-in Source Measure Unit 1003C with Industrial-Grade Reliability and Scalability
Feb 24, 2025 -
00:24
![30V/1A Single-channel Sub Card DC Source Measure Unit CS100]( "30V/1A Single-channel Sub Card DC Source Measure Unit CS100")
30V/1A Single-channel Sub Card DC Source Measure Unit CS100
Feb 24, 2025 -
00:24
![100V/1A Single-channel Sub Card DC Source Measure Unit CS200]( "100V/1A Single-channel Sub Card DC Source Measure Unit CS200")
100V/1A Single-channel Sub Card DC Source Measure Unit CS200
Feb 24, 2025 -
00:24
![300V/1A Single-channel Sub Card DC Source Measure Unit CS300]( "300V/1A Single-channel Sub Card DC Source Measure Unit CS300")
300V/1A Single-channel Sub Card DC Source Measure Unit CS300
Feb 24, 2025 -
00:27
![18V/1A Four-channel Sub Card Source DC Measure Unit CS402]( "18V/1A Four-channel Sub Card Source DC Measure Unit CS402")
18V/1A Four-channel Sub Card Source DC Measure Unit CS402
Feb 24, 2025 -
00:27
![10V/500mA Four-channel Sub Card DC Source Measure Unit CS401]( "10V/500mA Four-channel Sub Card DC Source Measure Unit CS401")
10V/500mA Four-channel Sub Card DC Source Measure Unit CS401
Feb 24, 2025 -
00:29
![10V/200mA Four-channel Sub Card Source Meter CS400 for High-Throughput Testing in Parallel Environments]( "10V/200mA Four-channel Sub Card Source Meter CS400 for High-Throughput Testing in Parallel Environments")
10V/200mA Four-channel Sub Card Source Meter CS400 for High-Throughput Testing in Parallel Environments
Feb 24, 2025 -
00:36
![30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100]( "30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100")
30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100
Feb 24, 2025 -
01:24
![PRECISE Instrument | Source of Exploration Internal and External Consistency]( "PRECISE Instrument | Source of Exploration Internal and External Consistency")
PRECISE Instrument | Source of Exploration Internal and External Consistency
Feb 17, 2025
